Nanoscale charging hysteresis measurement by multifrequency electrostatic force spectroscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2888765
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1. Atomic Force Microscope
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5. Label-free and high-resolution protein/DNA nanoarray analysis using Kelvin probe force microscopy
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