Subnanometric measurements of evanescent wave penetration depth using total internal reflection microscopy combined with fluorescent correlation spectroscopy-Reference-Cited by-同舟云学术

Subnanometric measurements of evanescent wave penetration depth using total internal reflection microscopy combined with fluorescent correlation spectroscopy

Published:2004-10-25 Issue:17 Volume:85 Page:3917-3919
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Harlepp S.,Robert J.,Darnton N. C.,Chatenay D.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1802374

Reference11 articles.

1. Measurement of colloidal forces with TIRM

2. Variable-angle total internal reflection fluorescence microscopy (VA-TIRFM): realization and application of a compact illumination device

3. The active form of cytochrome c oxidase: effects of detergent, the intact membrane, and radiation inactivation

4. A Single-Molecule Study of RNA Catalysis and Folding

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