Growth of amorphous-layer-free microcrystalline silicon on insulating glass substrates by plasma-enhanced chemical vapor deposition
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.119958
Reference10 articles.
1. Recent Progress in Microcrystalline Semiconductor Thin Films
2. Structure of Polycrystalline Silicon Thin Film Fabricated from Fluorinated Precursors by Layer-by-Layer Technique
3. Real-time spectroscopic ellipsometry study of the growth of amorphous and microcrystalline silicon thin films prepared by alternating silicon deposition and hydrogen plasma treatment
4. Bond Selectivity in Silicon Film Growth
5. Substrate dependence of initial growth of microcrystalline silicon in plasma‐enhanced chemical vapor deposition
Cited by 50 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Ultra‐thin electron collectors based on nc‐Si:H for high‐efficiency silicon heterojunction solar cells;Progress in Photovoltaics: Research and Applications;2021-11-21
2. Nanocrystalline silicon thin film growth and application for silicon heterojunction solar cells: a short review;Nanoscale Advances;2021
3. Effect of Seed Layer and Thermal Annealing on Structural and Optical Properties of Silicon Layers Deposited by PECVD;Journal of Electronic Materials;2019-03-25
4. Microcrystalline silicon thin films deposited by matrix-distributed electron cyclotron resonance plasma enhanced chemical vapor deposition using an SiF4 /H2chemistry;Journal of Physics D: Applied Physics;2016-06-21
5. Rear-emitter Si heterojunction solar cells with over 23% efficiency;Applied Physics Express;2015-01-30
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3