Deconvolution of charged particle spectra from neutron depth profiling using Simplex method
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3463692
Reference24 articles.
1. Technique for determining concentration profiles of boron impurities in substrates
2. Channeling, Blocking, and Range Measurements using Thermal Neutron Induced Reactions
3. Background in (n, p) and (n, α) Spectrometry
4. Neutron depth profiling: Overview and description of NIST facilities
5. D. Fink, “Neutron depth profiling,” Hahn-Meitner-Institut Report No. HMI-B 539, 1996.
Cited by 30 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Study of thin film composites based on LiCoO2 and C60 using neutron depth profiling and atomic force microscopy;Journal of Radioanalytical and Nuclear Chemistry;2024-09-13
2. Etching and Doping of Pores in Polyethylene Terephthalate Analyzed by Ion Transmission Spectroscopy and Nuclear Depth Profiling;Membranes;2022-10-28
3. Delithiation dynamics of the LICGC electrolyte out of the voltage limits;Surfaces and Interfaces;2022-10
4. Energy broadening of neutron depth profiles by thin polyamide films;Journal of Radioanalytical and Nuclear Chemistry;2022-09-07
5. Investigation of lithiation/delithiation processes in ceramic solid electrolyte by means of Neutron Depth Profiling;Journal of Power Sources;2022-09
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3