How silylene defects at (100) Si surfaces can account for the anomalous features observed via x-ray photoelectron spectroscopy
Author:
Publisher
AIP Publishing
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Reference54 articles.
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3. Assigning chemical configurations to the XPS features observed at pristine (100) Si surface resulting after etching in HF aqueous solution;Applied Surface Science;2010-08
4. Adsorption equilibria and kinetics of H2 at nearly ideal (2×1)Si(100) inner surfaces;Surface Science;2010-07
5. Comparing the IR spectra of H-terminated inner and outer silicon surfaces;Surface and Interface Analysis;2010-04-30
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