Bragg diffraction using a 100 ps 17.5 keV x-ray backlighter and the Bragg diffraction imager
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3491295
Reference13 articles.
1. Mikhaylushkinet al.Reply:
2. Microdynamics of Plastic Flow at Constant Stress
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4. Multiple film plane diagnostic for shocked lattice measurements (invited)
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