Multiple film plane diagnostic for shocked lattice measurements (invited)-Reference-Cited by-同舟云学术

Multiple film plane diagnostic for shocked lattice measurements (invited)

Published:2003-03 Issue:3 Volume:74 Page:1929-1934
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Kalantar Daniel H.,Bringa E.,Caturla M.,Colvin J.,Lorenz K. T.,Kumar M.,Stölken J.,Allen A. M.,Rosolankova K.,Wark J. S.,Meyers M. A.,Schneider M.,Boehly T. R.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1538325

Reference11 articles.

1. A constitutive model for metals applicable at high‐strain rate

2. Dislocation multiplication behind the shock front

3. Rise‐time measurements of shock transitions in aluminum, copper, and steel

4. X-ray Diffraction Evidence for Crystalline Order and Isotropic Compression during the Shock-wave Process

5. X-ray Diffraction Evidence for Crystalline Order and Isotropic Compression during the Shock-wave Process

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