Influence of surface roughness and internal strain on defect spectrum and intensity of low-temperature photoluminescence of thin Si1−xGex layers
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1739288
Reference34 articles.
1. SILICON:GERMANIUM HETEROJUNCTION BIPOLAR TRANSISTORS: FROM EXPERIMENT TO TECHNOLOGY
2. Silicon-based semiconductor heterostructures: column IV bandgap engineering
3. Reliability of GaAs-based semiconductor diode lasers: 0.6-1.1 mu m
4. Identification of a Mobility-Limiting Scattering Mechanism in Modulation-Doped Si/SiGe Heterostructures
5. Totally relaxed GexSi1−xlayers with low threading dislocation densities grown on Si substrates
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