Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy-Reference-Cited by-同舟云学术

Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy

Published:2012-12-17 Issue:25 Volume:101 Page:253108
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Hashimoto Ayako¹²³,Wang Peng⁴,Shimojo Masayuki²⁵,Mitsuishi Kazutaka¹²³,Nellist Peter D.⁴,Kirkland Angus I.⁴,Takeguchi Masaki¹³

Affiliation:

1. Surface Physics and Structure Unit, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba 305-0047, Japan

2. Global Research Center for Environment and Energy based on Nanomaterials Science, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba 305-0047, Japan

3. Transmission Electron Microscopy Station, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba 305-0047, Japan

4. Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom

5. Department of Materials Science and Technology, Shibaura Institute of Technology, 3-7-5 Toyosu, Koto-ku, Tokyo 135-8548, Japan

Funder

Engineering and Physical Sciences Research Council

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4772514

Reference20 articles.

1. Transmission electron microtomography in polymer research

2. Three-Dimensional Transmission Electron Microscopy: A Novel Imaging and Characterization Technique with Nanometer Scale Resolution for Materials Science

3. Quantification of metallic nanoparticle morphology on TiO2 using HAADF-STEM tomography

4. TEM stereo-imaging of mesoporous zeolite single crystalsElectronic supplementary information (ESI) available: a sequence of images. See http://www.rsc.org/suppdata/cc/b2/b212646j/

5. Three-dimensional imaging of individual hafnium atoms inside a semiconductor device

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