Experimental setup combining in situ hard X-ray photoelectron spectroscopy and real-time surface X-ray diffraction for characterizing atomic and electronic structure evolution during complex oxide heterostructure growth-Reference-Cited by-同舟云学术

Experimental setup combining in situ hard X-ray photoelectron spectroscopy and real-time surface X-ray diffraction for characterizing atomic and electronic structure evolution during complex oxide heterostructure growth

Published:2019-09 Issue:9 Volume:90 Page:093902
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Eres Gyula¹^ORCID,Rouleau C. M.²,Lu Q.¹,Zhang Z.³,Benda E.³^ORCID,Lee Ho Nyung¹^ORCID,Tischler J. Z.³^ORCID,Fong D. D.⁴^ORCID

Affiliation:

1. Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

2. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

3. X-Ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, Illinois 60439, USA

4. Materials Science Division, Argonne National Laboratory, Lemont, Illinois 60439, USA

Funder

Basic Energy Sciences

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5116135

Reference58 articles.

1. Picoscale materials engineering

2. Emergent phenomena at oxide interfaces

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4. Why some interfaces cannot be sharp

5. Control of octahedral connectivity in perovskite oxide heterostructures: An emerging route to multifunctional materials discovery

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