Low voltage electron diffractive imaging of atomic structure in single-wall carbon nanotubes-Reference-Cited by-同舟云学术

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Low voltage electron diffractive imaging of atomic structure in single-wall carbon nanotubes

Published:2011-04-25 Issue:17 Volume:98 Page:174103
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Kamimura Osamu,Maehara Yosuke,Dobashi Takashi,Kobayashi Keita,Kitaura Ryo,Shinohara Hisanori,Shioya Hiroyuki,Gohara Kazutoshi

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3582240

Reference29 articles.

1. Direct Observation of Six-Membered Rings in the Upper and Lower Walls of a Single-Wall Carbon Nanotube by Spherical Aberration-Corrected HRTEM

2. Direct Imaging of Lattice Atoms and Topological Defects in Graphene Membranes

3. Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage

4. Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy

5. Image reconstruction from electron and X-ray diffraction patterns using iterative algorithms: experiment and simulation

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