Probing electron charging in nanocrystalline Si dots using Kelvin probe force microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1804250
Reference18 articles.
1. Emission lifetime of polarizable charge stored in nano-crystalline Si based single-electron memory
2. Nanocrystalline silicon electron emitter with a high efficiency enhanced by a planarization technique
3. Photoluminescence of surface‐nitrided nanocrystalline silicon dots
4. Kelvin probe force microscopy
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