Visualization of nanocrystalline CuO in the grain boundaries of Cu2O thin films and effect on band bending and film resistivity-Reference-Cited by-同舟云学术

Visualization of nanocrystalline CuO in the grain boundaries of Cu2O thin films and effect on band bending and film resistivity

Published:2018-09 Issue:9 Volume:6 Page:096103
ISSN:2166-532X
Container-title:APL Materials
language:en
Short-container-title:APL Materials

Author:

Deuermeier Jonas¹^ORCID,Liu Hongjun²,Rapenne Laetitia²,Calmeiro Tomás¹,Renou Gilles³,Martins Rodrigo¹,Muñoz-Rojas David²^ORCID,Fortunato Elvira¹

Affiliation:

1. i3N/CENIMAT, Department of Materials Science, Faculty of Science and Technology, Universidade NOVA de Lisboa and CEMOP/UNINOVA, Campus de Caparica, 2829-516 Caparica, Portugal

2. Université Grenoble Alpes, CNRS, Grenoble INP, LMGP, F-38000 Grenoble, France

3. Université Grenoble Alpes, CNRS, SIMAP, F-38042 Saint-Martin d’Hères, France

Funder

Ministère de l'Éducation Nationale

Agence Nationale de la Recherche

Horizon 2020 Framework Programme

FP7 People: Marie-Curie Actions

Fundação para a Ciência e a Tecnologia

Publisher

AIP Publishing

Subject

General Engineering,General Materials Science

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5042046

Reference32 articles.

1. Intensity of Optical Absorption by Excitons

2. Absorption coefficient of bulk and thin film Cu2O

3. HALL EFFECT AND ELECTRICAL CONDUCTIVITY OF Cu2O MONOCRYSTALS

4. Hall mobility of cuprous oxide thin films deposited by reactive direct-current magnetron sputtering

5. Growth of ∼5 cm2V−1s−1 mobility, p-type Copper(I) oxide (Cu2O) films by fast atmospheric atomic layer deposition (AALD) at 225°C and below

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