Thin-film characterization by terahertz time-domain spectroscopy using grating-assisted excitation of guided modes
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3085996
Reference11 articles.
1. THz time domain spectroscopy of pulsed laser deposited BaTiO3 thin films
2. Proceedings of the IRMMW/THz 2004;Garet F.,2004
3. Far-infrared dielectric constant of porous silicon layers measured by terahertz time-domain spectroscopy
4. Characterization of thin polymer films using terahertz time-domain interferometry
5. Dielectric constant measurement of thin films by differential time-domain spectroscopy
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