Extended Tauc–Lorentz model (XTL) with log-normal distributed bandgap energies for optical permittivity in polycrystalline semiconductors

Author:

Xu Chencheng1ORCID,Min Byungsul1ORCID,Reineke-Koch Rolf1ORCID

Affiliation:

1. Institute for Solar Energy Research Hamelin (ISFH), Am Ohrberg 1, 31860 Emmerthal, Germany

Abstract

An extended Tauc–Lorentz model is proposed to incorporate the bandgap variation in different grains in the polycrystalline semiconductors. The probability of a certain bandgap in the Tauc–Lorentz model is assumed to follow a log-normal distribution. After a Kramer–Kronig transform, the real part of this model is suggested as well. A comparison between this model and the experimental data in polycrystalline Si is carried out to validate this model. The experimental variation of grain size in the polycrystalline Si thin film can be correlated with the width of log-normal distribution of bandgap energies.

Funder

Bundesministerium für Wirtschaft und Energie

Publisher

AIP Publishing

Subject

General Physics and Astronomy

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