An electrode-free method of characterizing the microwave dielectric properties of high-permittivity thin films-Reference-Cited by-同舟云学术

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An electrode-free method of characterizing the microwave dielectric properties of high-permittivity thin films

Published:2011-01-15 Issue:2 Volume:109 Page:024106
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Bovtun V.,Pashkov V.,Kempa M.,Kamba S.,Eremenko A.,Molchanov V.,Poplavko Y.,Yakymenko Y.,Lee J. H.,Schlom D. G.

Funder

National Science Foundation

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3537835

Reference19 articles.

1. Ferroelectric Materials for Microwave Tunable Applications

2. Clamping effect on the microwave properties of ferroelectric thin films

3. Interface-induced phenomena in polarization response of ferroelectric thin films

4. Determination of dielectric constant and loss of high-K thin films in the microwave frequencies

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