Scanning Lorentz electron microscope with high resolution and observation of bit profiles recorded on sputtered longitudinal media (invited)
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.353534
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1. Investigation of 2 Gb/in/sup 2/ magnetic recording at a track density of 17 kTPI
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3. The direct determination of magnetic domain wall profiles by differential phase contrast electron microscopy
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