The direct determination of magnetic domain wall profiles by differential phase contrast electron microscopy
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference19 articles.
1. Significance of Electromagnetic Potentials in the Quantum Theory
2. The Electron Interference Method for Magnetization Measurement of Thin Films
3. Electron Microscopy in Materials Science;Jakubovics,1975
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