Neutron radiation effects on an electronic system on module-Reference-Cited by-同舟云学术

Neutron radiation effects on an electronic system on module

Published:2020-08-01 Issue:8 Volume:91 Page:083301
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Lo Presti Domenico¹²^ORCID,Medina Nilberto H.³^ORCID,Guazzelli Marcilei A.⁴^ORCID,Moralles Mauricio⁵^ORCID,Aguiar Vitor A. P.³^ORCID,Oliveira José R. B.³^ORCID,Added Nemitala³^ORCID,Macchione Eduardo L. A.³^ORCID,Siqueira Paulo de Tarso D.⁵^ORCID,Zahn Guilherme⁵^ORCID,Genezini Frederico⁵^ORCID,Bonanno Danilo²^ORCID,Gallo Giuseppe¹⁶^ORCID,Russo Salvatore⁶^ORCID,Sgouros Onoufrios⁶^ORCID,Muoio Annamaria⁶^ORCID,Pandola Luciano⁶^ORCID,Cappuzzello Francesco¹⁶^ORCID,

Affiliation:

1. Dipartimento di Fisica e Astronomia Ettore Majorana, Università di Catania, 95123 Catania, Italy

2. Istituto Nazionale di Fisica Nucleare, Sezione di Catania, 95123 Catania, Italy

3. Instituto de Fisica, Universidade de São Paulo, 05508-090 São Paulo, Brazil

4. Centro Universitário FEI, 09850-901 São Bernardo do Campo, Brazil

5. Instituto de Pesquisas Energéticas e Nucleares, 05508-000 São Paulo, Brazil

6. Istituto Nazionale di Fisica Nucleare, Laboratori Nazionali del Sud, 95123 Catania, Italy

Funder

European Research CouncilEuropean Union Horizon 2020 Research and Innovation Program

Financiadora de Estudos e Projetos

Fundação de Amparo à Pesquisa do Estado de São Paulo

Instituto Nacional de Ciência e Tecnologia: Física Nuclear e Aplicações

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/5.0010968

Reference22 articles.

1. Reliability and Radiation Effects in Compound Semiconductors

2. J. R. Schwank, M. R. Shaneyfelt, and P. E. Dodd, “Radiation hardness assurance testing of microelectronic devices and integrated circuits: Radiation environments, physical mechanisms and foundations for hardness assurance,” Document 2008-6851P, Sandia National Laboratories, 2008.

3. Radiation effects on electronic devices in space

4. Heavy ion charge exchange reactions as probes for nuclear β-decay

5. Challenges for high rate signal processing for the NUMEN experiment

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