In situ electrical characterization of palladium-based single electron transistors made by electromigration technique
Author:
Affiliation:
1. CIC nanoGUNE, Tolosa Hiribidea 76, 20018 Donostia, San Sebastian, Basque Country, Spain
2. I.N.T.I. – CONICET and ECyT-UNSAM, San Martín, Bs As, Argentina
3. IKERBASQUE, Basque Foundation for Science, 48011 Bilbao, Basque Country, Spain
Funder
European Commission Directorate-General for Research and Innovation
European Research Council (ERC)
Eusko Jaurlaritza (Basque Government)
Ministerio de Economía y Competitividad (Ministry of Economy and Competitiveness)
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://scitation.aip.org/deliver/fulltext/aip/journal/adva/4/11/1.4902170.pdf?itemId=/content/aip/journal/adva/4/11/10.1063/1.4902170&mimeType=pdf&containerItemId=content/aip/journal/adva
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