Preparation of layered thin film samples for angle-resolved photoemission spectroscopy-Reference-Cited by-同舟云学术

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Preparation of layered thin film samples for angle-resolved photoemission spectroscopy

Published:2014-09-22 Issue:12 Volume:105 Page:121608
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Harrison S. E.¹²,Zhou B.²³,Huo Y.¹,Pushp A.⁴,Kellock A. J.⁴,Parkin S. S. P.⁴,Harris J. S.¹,Chen Y.²³,Hesjedal T.²

Affiliation:

1. Department of Electrical Engineering, Stanford University, Stanford, California 94305, USA

2. Clarendon Laboratory, Department of Physics, University of Oxford, Oxford OX1 3PU, United Kingdom

3. Lawrence Berkeley National Laboratory, Advanced Light Source, Berkeley, California 94720, USA

4. IBM Almaden Research Center, 650 Harry Road, San Jose, California 95120, USA

Funder

DARPA MESO

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4896632

Reference27 articles.

1. 2D materials: to graphene and beyond

2. Progress, Challenges, and Opportunities in Two-Dimensional Materials Beyond Graphene

3. Electric Field Effect in Atomically Thin Carbon Films

4. Summary Abstract: Fabrication of ultrathin heterostructures with van der Waals epitaxy

5. Van der Waals epitaxy—a new epitaxial growth method for a highly lattice-mismatched system

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