Phase field modeling of grain boundary migration and preferential grain growth driven by electric current stressing-Reference-Cited by-同舟云学术

Phase field modeling of grain boundary migration and preferential grain growth driven by electric current stressing

Published:2018-11-07 Issue:17 Volume:124 Page:175109
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Liang S. B.¹²^ORCID,Ke C. B.¹²,Wei C.¹³,Zhou M. B.¹²^ORCID,Zhang X. P.¹²

Affiliation:

1. School of Materials Science and Engineering, South China University of Technology, Guangzhou 510640, China

2. Guangdong Provincial Engineering Technology R&D Center of Electronic Packaging Materials and Reliability, South China University of Technology, Guangzhou 510640, China

3. School of Civil Engineering and Transportation, South China University of Technology, Guangzhou 510640, China

Funder

National Natural Science Foundation of China

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5045637

Reference34 articles.

1. On the theory of normal and abnormal grain growth

2. Stress induced grain boundary motion

3. Experimental Observations of Stress-Driven Grain Boundary Migration

4. Boundary migration in Zn bicrystal induced by a high magnetic field

5. Analysis of the elastic strain energy driving force for grain boundary migration using phase field simulation

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