High-throughput heterodyne thermoreflectance: Application to thermal conductivity measurements of a Fe–Si–Ge thin film alloy library-Reference-Cited by-同舟云学术

High-throughput heterodyne thermoreflectance: Application to thermal conductivity measurements of a Fe–Si–Ge thin film alloy library

Published:2017-07 Issue:7 Volume:88 Page:074902
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

d’Acremont Quentin¹²,Pernot Gilles³^ORCID,Rampnoux Jean-Michel¹,Furlan Andrej⁴^ORCID,Lacroix David³,Ludwig Alfred⁴^ORCID,Dilhaire Stefan¹

Affiliation:

1. Laboratoire Ondes et Matière d’Aquitaine (LOMA), UMR 5798, CNRS-Université de Bordeaux, 33400 Talence, France

2. Amplitude-Systemes, 11 Avenue de la Canteranne Cité de la Photonique, 33600 Pessac, France

3. Laboratoire d’Energétique et de Mécanique Théorique et Appliquée (LEMTA), UMR 7563, CNRS-Université de Lorraine, ENSEM, 2 Avenue de la Forêt de Haye, TSA 60604, 54518 Vandoeuvre-lès-Nancy Cedex, France

4. Institute for Materials, Ruhr-Universität Bochum, 44801 Bochum, Germany

Funder

Agence Nationale de la Recherche (ANR)

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4986469

Reference22 articles.

1. Precise control of thermal conductivity at the nanoscale through individual phonon-scattering barriers

2. Superdiffusive heat conduction in semiconductor alloys. II. Truncated Lévy formalism for experimental analysis

3. Transient thermoreflectance from thin metal films

4. Transient thermoreflectance from metal films

5. Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy

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