Operando atomic force microscopy study of electric double-layer transistors based on ionic liquid/rubrene single crystal interfaces-Reference-Cited by-同舟云学术

Operando atomic force microscopy study of electric double-layer transistors based on ionic liquid/rubrene single crystal interfaces

Published:2021-06-14 Issue:24 Volume:118 Page:243301
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Morino Yusuke¹^ORCID,Yokota Yasuyuki²³^ORCID,Bando Ken-ichi¹,Hara Hisaya¹,Imanishi Akihito¹^ORCID,Takeya Jun⁴,Fukui Ken-ichi¹⁵^ORCID

Affiliation:

1. Department of Materials Engineering Science, Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan

2. Surface and Interface Science Laboratory, RIKEN, 2-1 Hirosawa, Wako, Saitama 351-0198, Japan

3. JST PRESTO, 4‐1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan

4. Department of Advanced Materials Science, Graduate School of Frontier Sciences, The University of Tokyo, 5‐1-5 Kashiwanoha, Kashiwa, Chiba 277-8561, Japan

5. Department of Photomolecular Science, Institute of Molecular Science, Myodaiji, Okazaki, Aichi 444-8585, Japan

Funder

Japan Society for the Promotion of Science

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0053848

Reference30 articles.

1. The path to ubiquitous and low-cost organic electronic appliances on plastic

2. Colloquium: Electronic transport in single-crystal organic transistors