Quantitative determination of twist angle and strain in Van der Waals moiré superlattices-Reference-Cited by-同舟云学术

Quantitative determination of twist angle and strain in Van der Waals moiré superlattices

Published:2024-09-09 Issue:11 Volume:125 Page:
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:

Author:

Tran Steven J.¹²^ORCID,Uslu Jan-Lucas³^ORCID,Pendharkar Mihir¹⁴^ORCID,Finney Joe¹²^ORCID,Sharpe Aaron L.¹²,Hocking Marisa¹⁴^ORCID,Bittner Nathan J.⁵^ORCID,Watanabe Kenji⁶^ORCID,Taniguchi Takashi⁷^ORCID,Kastner Marc A.¹²⁸^ORCID,Mannix Andrew J.¹⁴^ORCID,Goldhaber-Gordon David¹²^ORCID

Affiliation:

1. Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory 1 , Menlo Park, California 94025, USA

2. Department of Physics, Stanford University 2 , Stanford, California 94305, USA

3. JARA-FIT and 2nd Institute of Physics, RWTH Aachen University 3 , 52074 Aachen, Germany

4. Department of Materials Science and Engineering, Stanford University 4 , Stanford, California 94305, USA

5. Independent Researcher 5 , Minneapolis, Minnesota 55419, USA

6. Research Center for Electronic and Optical Materials, National Institute for Materials Science 6 , 1-1 Namiki, Tsukuba 305-0044, Japan

7. Research Center for Materials Nanoarchitectonics, National Institute for Materials Science 7 , 1-1 Namiki, Tsukuba 305-0044, Japan

8. Department of Physics, Massachusetts Institute of Technology 8 , Cambridge, Massachusetts 02139, USA

Abstract

Scanning probe techniques are popular, nondestructive ways to visualize the real space structure of Van der Waals moirés. The high lateral spatial resolution provided by these techniques enables extracting the moiré lattice vectors from a scanning probe image. We have found that the extracted values, while precise, are not necessarily accurate. Scan-to-scan variations in the behavior of the piezos that drive the scanning probe and thermally driven slow relative drift between probe and sample produce systematic errors in the extraction of lattice vectors. In this Letter, we identify the errors and provide a protocol to correct for them. Applying this protocol to an ensemble of ten successive scans of near-magic-angle twisted bilayer graphene, we are able to reduce our errors in extracting lattice vectors to less than 1%. This translates to extracting twist angles with a statistical uncertainty less than 0.001° and uniaxial heterostrain with uncertainty on the order of 0.002%.

Funder

U.S. Department of Energy

National Science Foundation

Gordon and Betty Moore Foundation

Japan Society for the Promotion of Science

SLAC National Accelerator Laboratory

Publisher

AIP Publishing

Link

https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/5.0223777/20155606/113106_1_5.0223777.pdf

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