Simultaneous detection of optical constants ε1and ε2by Brewster angle reflectivity measurements
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.106986
Reference9 articles.
1. New method for determining the optical constants by the angular modulation of reflectance
2. Line‐shape analysis of reflectance spectra from GaAs/AlAs multiple‐quantum‐well structures
3. Comparison of Reflection Methods for Measuring Optical Constants without Polarimetric Analysis, and Proposal for New Methods based on the Brewster Angle
4. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors
5. Electrochemical Photocapacitance Spectroscopy: A New Method for Characterization of Deep Levels in Semiconductors
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1. Brewster-Angle Variable Polarization Spectroscopy of Colloidal Au-Nanospheres and -Nanorods at the Silicon Surface;The Journal of Physical Chemistry C;2012-03-28
2. Tailoring of Interfaces for the Photoelectrochemical Conversion of Solar Energy;Advances in Electrochemical Sciences and Engineering;2011-03-22
3. A reflectometer for the combined measurement of refractive index, microroughness, macroroughness and gloss of low-extinction surfaces;Measurement Science and Technology;2009-01-20
4. Brewster-angle analysis of native and photoelectrochemically grown silicon oxide nanotopographies;Surface Science;2007-09
5. Combined AFM and Brewster-angle analysis of gradually etched ultrathin SiO2 – Comparison with SRPES results;Surface Science;2007-04
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