Modulated photoconductivity study of electron drift mobility in amorphous silicon
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.372275
Reference13 articles.
1. Theory of trap-controlled transient photoconduction
2. Ambipolar transport in amorphous semiconductors in the lifetime and relaxation-time regimes investigated by the steady-state photocarrier grating technique
3. Theory of the steady-state-photocarrier-grating technique for obtaining accurate diffusion-length measurements in amorphous silicon
4. Continuous decay of drift mobility in intrinsic a-Si:H and a-SiC:H upon light soaking investigated by the photomixing technique
5. The effect on recombination in amorphous semiconductors of transitions between localized states
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Nonequilibrium Occupancy of Dangling Bond Defects in Undoped Amorphous Silicon Studied by Subgap-Light-Induced Electron Spin Resonance;Japanese Journal of Applied Physics;2004-06-09
2. The modulated photocurrent technique: a powerful tool to investigate band gap states in silicon based thin films;physica status solidi (c);2004-03
3. Modulated photocurrents in a sandwich-cell structure: II. Influence of bias illumination intensity and carrier diffusion;Journal of Physics: Condensed Matter;2003-08-01
4. Photocarrier transport in undoped microcrystalline silicon studied by the modulated photocurrent technique;Journal of Applied Physics;2003
5. Density of states in the gap of amorphous semiconductors determined from modulated photocurrent measurements in the recombination regime;Journal of Applied Physics;2002-06
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3