Difference between the forces measured by an optical lever deflection and by an optical interferometer in an atomic force microscope
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1145131
Reference12 articles.
1. Atomic Force Microscope
2. Force microscope using a fiber‐optic displacement sensor
3. Novel optical approach to atomic force microscopy
4. A differential interferometer for force microscopy
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