Ultrafast sensing of photoconductivity decay using microwave resonators-Reference-Cited by-同舟云学术

Ultrafast sensing of photoconductivity decay using microwave resonators

Published:2019-12-21 Issue:23 Volume:126 Page:235702
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Gyüre-Garami B.¹,Blum B.¹^ORCID,Sági O.¹,Bojtor A.¹,Kollarics S.¹^ORCID,Csősz G.¹,Márkus B. G.¹^ORCID,Volk J.²^ORCID,Simon F.¹^ORCID

Affiliation:

1. Department of Physics, Budapest University of Technology and Economics and MTA-BME Lendület Spintronics Research Group (PROSPIN), PO Box 91, H-1521 Budapest, Hungary

2. Institute of Technical Physics and Materials Science, Centre for Energy Research, Konkoly-Thege M. út 29-33, H-1121 Budapest, Hungary

Funder

EMMI

Hungarian Scientific Research Fund

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5129597

Reference51 articles.

1. Instrument measuring temperature dependence of minority‐carrier lifetime without contact

2. The study of charge carrier kinetics in semiconductors by microwave conductivity measurements

3. Detailed analysis of the microwave-detected photoconductance decay in crystalline silicon

4. Contactless electrical defect characterization in semiconductors by microwave detected photo induced current transient spectroscopy (MD-PICTS) and microwave detected photoconductivity (MDP)

5. Large grained and high charge carrier lifetime CH3NH3PbI3 thin-films: implications for perovskite solar cells

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