Extremely low‐noise potentiometry with a scanning tunneling microscope
-
Published:1989-03
Issue:3
Volume:60
Page:301-305
-
ISSN:0034-6748
-
Container-title:Review of Scientific Instruments
-
language:en
-
Short-container-title:Review of Scientific Instruments
Author:
Pelz J. P.,Koch R. H.
Cited by
50 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献