Photo-thermal quartz tuning fork excitation for dynamic mode atomic force microscope
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4896784
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1. Piezoelectric tip‐sample distance control for near field optical microscopes
2. Atomic force microscope for accurate dimensional metrology
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4. Dynamic behavior of the tuning fork AFM probe
5. Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes
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3. Calibration Tools for Scanning Thermal Microscopy Probes Used in Temperature Measurement Mode;Journal of Heat Transfer;2019-05-14
4. Calibrating conservative and dissipative response of electrically-driven quartz tuning forks;Ultramicroscopy;2017-03
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