Optical Analysis of Nanocrystalline ZnO Films Coated on Porous Silicon by Radio Frequency (RF) Magnetron Sputtering-Reference-Cited by-同舟云学术

Optical Analysis of Nanocrystalline ZnO Films Coated on Porous Silicon by Radio Frequency (RF) Magnetron Sputtering

Published:2011-01 Issue:5 Volume:18 Page:441-448
ISSN:0927-6440
Container-title:Composite Interfaces
language:en
Short-container-title:Composite Interfaces

Author:

Chuah L. S.¹,Hassan Z.²,Bakhori S. K. Mohd³,Al-Hardan N. H.⁴,Abdullah M. J.⁵

Affiliation:

1. a Physics Section, School of Distance Education, Universiti Sains Malaysia, 11800 Penang, Malaysia; ; chuahleesiang@usm.my, Email: chuahleesiang@yahoo.com

2. b School of Physics, Universiti Sains Malaysia, 11800 Minden, Penang, Malaysia

3. c School of Physics, Universiti Sains Malaysia, 11800 Minden, Penang, Malaysia

4. d School of Physics, Universiti Sains Malaysia, 11800 Minden, Penang, Malaysia

5. e School of Physics, Universiti Sains Malaysia, 11800 Minden, Penang, Malaysia

Publisher

Informa UK Limited

Subject

Surfaces, Coatings and Films,General Physics and Astronomy,Ceramics and Composites

Link

https://www.tandfonline.com/doi/pdf/10.1163/156855411X595843

Reference24 articles.

1. Porous and Nanoporous Semiconductors and Emerging Applications

2. Porous Si(111) and Si(100) as an intermediate buffer layer for nanocrystalline InN films

3. Porous silicon—mechanisms of growth and applications

4. Porous Silicon as an Intermediate Buffer Layer for Zinc Oxide Nanorods

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