Parental Inbred Lines of the Nested Association Mapping (NAM) Population of Corn Show Sources of Resistance to Tar Spot in Northern Indiana

Abstract

Tar spot is a major foliar disease of corn caused by the obligate fungal pathogen Phyllachora maydis, first identified in Indiana in 2015. Under conducive weather conditions, P. maydis causes significant yield losses in the United States and other countries, constituting a major threat to corn production. Relatively little is known about resistance to tar spot other than a major quantitative gene that was identified in tropical maize lines. To test for additional sources of resistance against populations of P. maydis in North America, 26 parental inbred lines of the nested associated mapping (NAM) population were evaluated for tar spot resistance in Indiana in replicated field trials under natural infection for 3 years. Tar spot disease severity was scored visually using a 0-to-100% scale. Maximum disease severity (MDS) for tar spot scoring at reproductive growth stage ranged from 0 to 48.3%, with 0% being most resistant and 48.3% being most susceptible. Nine inbred lines were resistant to P. maydis with MDS ranging from 0 to 5.0%, six were moderately resistant (5.2 to 10.6% MDS), two were moderately susceptible (11.7 to 26.0% MDS), and the remaining eight inbred lines were rated as susceptible (30.0 to 48.3% MDS). There was some variability between years, due to higher disease pressure after 2019. Inbred B73, the common parent of the NAM populations, was rated as susceptible, with MDS of 30.0%. The nine highly resistant lines provide a potential source of new genes for genetic analysis and mapping of tar spot resistance in corn.