Controlling the Er content of porous silicon using the doping current intensity-Reference-Cited by-同舟云学术

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Controlling the Er content of porous silicon using the doping current intensity

Published:2014-07-04 Issue:1 Volume:9 Page:
ISSN:1556-276X
Container-title:Nanoscale Research Letters
language:en
Short-container-title:Nanoscale Res Lett

Author:

Mula Guido,Loddo Lucy,Pinna Elisa,Tiddia Maria V,Mascia Michele,Palmas Simonetta,Ruffilli Roberta,Falqui Andrea

Publisher

Springer Science and Business Media LLC

Subject

Condensed Matter Physics,General Materials Science

Link

http://link.springer.com/content/pdf/10.1186/1556-276X-9-332.pdf

Reference23 articles.

1. Reed G, Kewell A: Erbium-doped silicon and porous silicon for optoelectronics. Mater Sci Eng B 1996, 40: 207–215. 10.1016/0921-5107(96)01657-1

2. Bondarenko VP, Dorofeev AM, Vorozov NN, Leshok AA, Dolgii LN, Kazyuchits NM, Troyanova GN: Luminescence of erbium-doped porous silicon. Tech Phys Lett 1997, 23: 3–4. 10.1134/1.1261777

3. Marstein ES, Skjelnes JK, Finstad TG: Incorporation of erbium in porous silicon. Phys Scr 2002, T101: 103–105. 10.1238/Physica.Topical.101a00103

4. Kenyon AJ: Quantum confinement in rare-earth doped semiconductor systems. Curr Opin Solid State Mater Sci 2003, 7: 143–149. 10.1016/S1359-0286(03)00043-3

5. Kenyon AJ: Erbium in silicon. Semicond Sci Technol 2005, 20: R65-R84. 10.1088/0268-1242/20/12/R02

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1. Infiltration of Erbium ions (Er3+) in Porous Silicon Layer Synthesized by Electrochemical Method: Structural and Optical Properties Studies;Silicon;2024-09-12

2. Effects during the cathode polarization of porous silicon;Heliyon;2024-08

3. Physical and Chemical Control of Interface Stability in Porous Si–Eumelanin Hybrids;The Journal of Physical Chemistry C;2018-11-21

4. Doping porous silicon with erbium: pores filling as a method to limit the Er-clustering effects and increasing its light emission;Scientific Reports;2017-07-20

5. Non-rigid alignment in electron tomography in materials science;Journal of Microscopy;2016-03-28

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