Cross-Sectional Investigations on Epitaxial Silicon Solar Cells by Kelvin and Conducting Probe Atomic Force Microscopy: Effect of Illumination-Reference-Cited by-同舟云学术

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Cross-Sectional Investigations on Epitaxial Silicon Solar Cells by Kelvin and Conducting Probe Atomic Force Microscopy: Effect of Illumination

Published:2016-02-01 Issue:1 Volume:11 Page:
ISSN:1931-7573
Container-title:Nanoscale Research Letters
language:en
Short-container-title:Nanoscale Res Lett

Author:

Narchi Paul,Alvarez Jose,Chrétien Pascal,Picardi Gennaro,Cariou Romain,Foldyna Martin,Prod’homme Patricia,Kleider Jean-Paul,i Cabarrocas Pere Roca

Publisher

Springer Science and Business Media LLC

Subject

Condensed Matter Physics,General Materials Science

Link

http://link.springer.com/content/pdf/10.1186/s11671-016-1268-1.pdf

Reference22 articles.

1. Binnig G (1986) Atomic force microscopy. Phys Rev Lett 56(9):930–934, http://dx.doi.org/10.1103/PhysRevLett.56.930

2. Kalinin SV, Alexei G (2007) Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale., Volume 1, Springer Science & Business Media, Apr 3, 2007

3. Melitz W (2011) Kelvin probe microscopy and its applications. Surf Sci Rep 66:1–27. doi: 10.1016/j.surfrep.2010.10.001

4. Alvarez J, Houze F, Kleider JP, Liao MY, Koide Y (2006) Electrical characterization of Schottky diodes based on boron doped homoepitaxial diamond films by conducting probe atomic force microscopy. Superlattice Microst 40:343–349. doi: 10.1016/j.spmi.2006.07.027

5. Feijfar A, Hyvl M, Ledinski M, Vetushka A, Stuchlik J, Kocka J, Misra S, O’Donnell B, Foldyna M, Yu L, Roca P, Cabarrocas I (2013) Microscopic measurements of variations in local (photo)electronic properties in nanostructured solar cells. Sol Energy Mater Sol Cells 119:228–234. doi: 10.1016/j.solmat.2013.07.042

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1. Advances in the Use of Atomic Force Microscopy as a Diagnostic Tool for Solar Cells Characterization: From Material Design to Device Applications;physica status solidi (a);2023-12-03

2. Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives;Beilstein Journal of Nanotechnology;2023-06-14

3. Metal oxide nanofibers in solar cells;Metal Oxide-Based Nanofibers and Their Applications;2022

4. Photovoltaic distribution on an amorphous-silicon solar cell in near-band-edge excitation observed by conductive-probe atomic force microscopy combined with a fine-wavelength-tunable light source;Review of Scientific Instruments;2021-09-01

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