Advances in the Use of Atomic Force Microscopy as a Diagnostic Tool for Solar Cells Characterization: From Material Design to Device Applications

Abstract

Considerable efforts in search for an effective characterization technique for photovoltaic devices with utmost precision is on the increase. For precise analysis and tailoring of device performance, a reliable technique is vital. Atomic force microscopy is one of the leading surface analysis techniques of choice for probing surface patterns in a variety of materials with atomic precision using a cantilever. It has evolved as a reliable technique for the investigation of subatomic scale properties of materials such as photocurrent heterogeneity, electromechanical response, charge distribution, molecular weight effects, and many other material parameters. The integration of artificial intelligence hybrid algorithms in atomic force microscope for optoelectronic device fabrication and characterization has increasingly emerged to be desirable due to its reliability and effectiveness in achieving high image resolution, automated analysis, actuation, and the coupling of manufactured units with a precision down to atomic units. In this review, an investigation of topical developments in the use of atomic force microscopy as a diagnostic tool for solar cells characterization is presented with special focus on polymer solar cells, perovskite solar cells, quantum dots‐sensitized solar cells, dye‐sensitized solar cells, fullerene‐based solar cells, III‐V‐based solar cells, and silicon‐based solar cells.