Author:
Shin Seung Chul,Ahn Do Hwan,Kim Su Jin,Pyo Chul Woo,Lee Hyoungseok,Kim Mi-Kyeong,Lee Jungeun,Lee Jong Eun,Detrich H William,Postlethwait John H,Edwards David,Lee Sung Gu,Lee Jun Hyuck,Park Hyun
Publisher
Springer Science and Business Media LLC
Cited by
81 articles.
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