Analysis of TOF-SIMS spectra using quaternary ammonium ions for mass scale calibration
Author:
Affiliation:
1. Research Center, ASAHI GLASS CO., LTD.
2. Yokohama R&D Laboratories, Furukawa Electric CO., LTD.
3. Material Analysis Technology Division, KONICAMINOLTA, INC.
Publisher
Surface Analysis Society of Japan
Link
https://www.jstage.jst.go.jp/article/jsa/20/3/20_187/_pdf
Reference12 articles.
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2. [2] S. Reichlmaier, J. S. Hammond, M. J. Hearn, D. Briggs, Surf. Interface Anal. 21 , 739 (1994).
3. [3] I. S. Gilmore, F. M. Green and M. P. Seah, Surf. Interface Anal. 39 , 817 (2007).
4. [4] F. M. Green, I. S. Gilmore, J. L. S. Lee, S. J. Spencer and M. P. Seah, Surf. Interface Anal. 42 , 129 (2010).
5. [5] Y. Abe, H. Itoh, S. Otomo and TOF-SIMS Working Group, J. Surf. Anal. 17 , 186 (2010).
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Mass scale calibration of TOF-SIMS spectra with molecular ions of internal additives;Surface and Interface Analysis;2016-08-15
2. Mass-scale calibration of TOF-SIMS spectra using quaternary ammonium ions;Surface and Interface Analysis;2014-06-11
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