Mass scale calibration of TOF-SIMS spectra with molecular ions of internal additives-Reference-Cited by-同舟云学术

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Mass scale calibration of TOF-SIMS spectra with molecular ions of internal additives

Published:2016-08-15 Issue:11 Volume:48 Page:1185-1189
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Kobayashi Daisuke¹,Aoyagi Satoka²,Otomo Shinya³,Itoh Hiroto⁴

Affiliation:

1. Innovative Technology Research Center; Asahi Glass Co., Ltd.; Kanagawa Japan

2. Department of Materials and Life Science; Seikei University; Tokyo Japan

3. Furukawa Electric Co., Ltd.; Tokyo Japan

4. Material Analysis Department; Konica Minolta, Inc.; Tokyo Japan

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference16 articles.

1. Measurement of glass surface contamination

2. High mass resolution time-of-flight secondary ion mass spectrometry. Application to peak assignments

3. Analysis of polymer surfaces by SIMS 17. An assessment of the accuracy of the mass assignment using a high mass resolution ToF-SIMS instrument

4. Static TOF-SIMS. A VAMAS interlaboratory study. Part II - accuracy of the mass scale and G-SIMS compatibility

5. Results of Inter-laboratory Tests among SASJ on Accurate Mass Scale Calibration of ToF-SIMS

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