Identification of Background in CMA-Reference-Cited by-同舟云学术

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Identification of Background in CMA

Published:2007 Issue:2 Volume:14 Page:95-103
ISSN:1341-1756
Container-title:Journal of Surface Analysis
language:en
Short-container-title:JSA

Author:

Alkafri Adel¹,Goto K.²,Ichikawa Y.¹,Shimizuc R.³

Affiliation:

1. Nagoya Institute of Technology (NIT)

2. Advanced Industrial Science and Technology (AIST)

3. Osaka Institute of Technology (OIT)

Publisher

Surface Analysis Society of Japan

Link

https://www.jstage.jst.go.jp/article/jsa/14/2/14_95/_pdf

Reference28 articles.

1. [1] K. D. Childs, B. A. Carlson, L. A. LaVanier, J. F. Moulder, D. F. Paul, W. F. Stickle, and D. G. Watson, Handbook of Auger Electron Spectroscopy, 3rd edition, Physical Electronics Industries (1994).

2. [2] Auger Electron Spectra Catalogue, ANELVA corporation (1979).

3. [3] T. Sekine, Y. Nagasawa, M. Kudoh, Y. Sakai, A. S. Parkes, D. J. Geller, A. Mogami, and K. Hirata, Handbook of Auger Electron Spectroscopy, JEOL (1982.).

4. [4] M. P. Seah, J. Electron Spectrosc. Relat. Phenom. 97, 235 (1998).

5. [5] M. P. Seah and G. C. Smith, Surf. Interface Anal. 15, 751 (1990).

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The Standard Auger Electron Spectra in The AIST DIO-DB(111); Ge(111);Journal of Surface Analysis;2008

2. Identification of Background in CMA;Journal of Surface Analysis;2007

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