Near Ambient Pressure X-ray Photoelectron Spectroscopy (NAP-XPS). Characterization of Non-Traditional Materials with the SPECS EnviroESCA Instrument-Reference-Cited by-同舟云学术

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Near Ambient Pressure X-ray Photoelectron Spectroscopy (NAP-XPS). Characterization of Non-Traditional Materials with the SPECS EnviroESCA Instrument

Published:2019 Issue:2 Volume:26 Page:162-163
ISSN:1341-1756
Container-title:Journal of Surface Analysis
language:en
Short-container-title:JSA

Author:

Patel Dhananjay I.¹,Dietrich Paul²,Thißen Andreas²,Linford Matthew R.¹

Affiliation:

1. Brigham Young University

2. SPECS Surface Nano Analysis GmbH

Publisher

Surface Analysis Society of Japan

Link

https://www.jstage.jst.go.jp/article/jsa/26/2/26_162/_pdf

Reference10 articles.

1. [1] M. R. Linford, T. Roychowdhury, D. Shah, Vac. Tech. Coatings August, 26 (2018).

2. [2] D. Shah, D. I. Patel, T. Roychowdhury, G. B. Rayner, N. O’Toole, D. R. Baer, and M. R. Linford, Journal of Vacuum Science & Technology B 36, 062902 (2018).

3. [3] D. I. Patel, S. Bahr, P. Dietrich, M. Meyer, A. Thißen, M. R. Linford, Argon, by Near-Ambient Pressure X-ray Photoelectron Spectroscopy (NAP-XPS). Surf. Sci. Spectra (2019).

4. [4] T. Roychowdhury, S. Bahr, P. Dietrich, M. Meyer, A. Thißen, and M. R. Linford, Surf. Sci. Spectra 26, 014015 (2019).

5. [5] D. Shah, T. Roychowdhury, S. Bahr, P. Dietrich, M. Meyer, A. Thißen, and M. R. Linford, Surf. Sci. Spectra 26, 014016 (2019).

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