Analog Circuit Fault Classification Using Improved One-Against-One Support Vector Machines
Author:
Publisher
Walter de Gruyter GmbH
Subject
Instrumentation,Control and Systems Engineering
Link
https://www.degruyter.com/view/j/mms.2011.xviii.issue-4/v10178-011-0055-7/v10178-011-0055-7.pdf
Reference19 articles.
1. Finding Ambiguity Groups in Low Testability Analog Circuits;J. Starzyk;IEEE Trans. Circuits and Syst.: Fundamental Theory and Applications,2000
2. A New Diagnosis Approach for Handling Tolerance in Analog and Mixed-Signal Circuits by Using Fuzzy Math;P. Wang;IEEE Trans. on Circuits and Systems-I: Regular Papers,2005
3. Fault Diagnosis of Analog Circuits;J. Bandler;Proc. IEEE,1985
4. Genetic-Algorithm-Based Method for Optimal Analog Test Points Selection;T. Golonek;IEEE Trans. on Circuits and Systems-II: Express Briefs,2007
5. Wavelet Energy-based Testing Using Supply Current Measurements;M. Dimopoulos;IET Sci. Meas. Technol,2009
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