Feature extraction of analogue circuit fault signals via cross‐wavelet transform and variational Bayesian matrix factorisation-Reference-Cited by-同舟云学术

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Feature extraction of analogue circuit fault signals via cross‐wavelet transform and variational Bayesian matrix factorisation

Published:2019-03 Issue:2 Volume:13 Page:318-327
ISSN:1751-8830
Container-title:IET Science, Measurement & Technology
language:en
Short-container-title:IET Science, Measurement & Technology

Author:

He Wei¹,He Yigang¹²,Li Bing¹,Zhang Chaolong¹³

Affiliation:

1. School of Electrical Engineering and AutomationHefei University of TechnologyHefeiPeople's Republic of China

2. School of Electrical EngineeringWuhan UniversityWuhanPeople's Republic of China

3. School of Physics and Electronic EngineeringAnqing Normal UniversityAnqingPeople's Republic of China

Funder

National Natural Science Foundation of China

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-smt.2018.5432

Reference42 articles.

1. Neural‐network based analog‐circuit fault diagnosis using wavelet transform as preprocessor;Aminian M.;IEEE Trans. Circuits Syst. II, Analog Digit. Signal Process.,2000

2. Fault diagnosis of electronic systems using intelligent techniques: a review

3. A novel approach of analog circuit fault diagnosis using support vector machines classifier;Cui J.;Measurement,2011

4. Diagnostics of filtered analog circuits with tolerance based on LS‐SVM using frequency features;Long B.;J. Electron. Test.,2012

5. A survey on fault diagnosis of analog circuits: Taxonomy and state of the art

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