Correlation between surface morphology and potential profile in OFETs with zone-cast TIPS-Pentacene as seen by scanning Kelvin probe microscopy-Reference-Cited by-同舟云学术

Correlation between surface morphology and potential profile in OFETs with zone-cast TIPS-Pentacene as seen by scanning Kelvin probe microscopy

Published:2019-06-01 Issue:2 Volume:37 Page:249-256
ISSN:2083-134X
Container-title:Materials Science-Poland
language:en
Short-container-title:

Author:

Kucinska M.¹,Szymanski M.Z.²,Frac I.¹,Chandezon F.³,Ulanski J.¹

Affiliation:

1. Department of Molecular Physics , Lodz University of Technology , Lodz , 90-924 , Poland

2. CEA, INAC-SPRAM, Grenoble , F-38000 , France

3. University Grenoble Alpes , CEA, CNRS, INAC, SyMMES, F-38000 Grenoble

Abstract

Abstract Charge-carrier transport in the channel of bottom gate, top contact organic field effect transistors with anisotropic layers of 6,13-bis(triisopropylsilylethynyl) pentacene (TIPS-Pentacene) obtained by zone casting was investigated using scanning Kelvin probe microscopy combined with atomic force microscopy. The TIPS-Pentacene continuous layers consisted of thin crystals unidirectionally oriented in the channel. Devices with perpendicular and parallel charge flow in the transistor channel were prepared. It was found that irregularities in the surface morphology at the semiconductor layer in the transistor channel are correlated with the local potential profile, and that the channel resistance strongly depends on the orientation of the TIPS-Pentacene crystals.

Publisher

Walter de Gruyter GmbH

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Link

https://www.sciendo.com/pdf/10.2478/msp-2019-0026

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