Influence of Leaf Diseases on Grain Yield and Yield Components in Winter Wheat-Reference-Cited by-同舟云学术

Influence of Leaf Diseases on Grain Yield and Yield Components in Winter Wheat

Published:2009-01-01 Issue:2 Volume:49 Page:
ISSN:1899-007X
Container-title:Journal of Plant Protection Research
language:
Short-container-title:

Author:

Ronis Antanas,Semaškienė Roma,Dabkevičius Zenonas,Liatukas Žilvinas

Publisher

Walter de Gruyter GmbH

Subject

Plant Science,Soil Science,Agronomy and Crop Science

Link

https://www.degruyter.com/view/j/jppr.2009.49.issue-2/v10045-009-0021-5/v10045-009-0021-5.pdf

Reference25 articles.

1. Anonymous. 2001. (Lietuvos žemės ūkio ministerija, Lietuvos valstybinis augalų veislių tyrimo centras). Tinkamiausių Lietuvoje auginti 2001 metais augalų veislių sąrašas. [in Lithuanian]. Vilnius: 40-41.

2. Yield reduction in wheat in relation to leaf disease from yellow (tan) spot and Septoria nodorum blotch;J. Bhathal;Eur. J. Plant Pathol,2003

3. Variation of yield components of spring wheat selection lines due to different meteorological conditions;M. Bleidere;Agronomijas Vestis,2003

4. Effects of Pyrenophora teres and weeds on barley yield and yield components;J. Burleigh;Phytopathology,1988

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Unified Methodology for Wheat Leaf Disease Identification: Combining CNN and Random Forest Approaches;2024 3rd International Conference for Innovation in Technology (INOCON);2024-03-01

2. A Hybrid CNN and Random Forest Approach for Wheat Disease Detection;2023 3rd International Conference on Smart Generation Computing, Communication and Networking (SMART GENCON);2023-12-29

3. Grain yield and quality losses caused by tan spot in wheat cultivars in Australia;PhytoFrontiers™;2023-10-19

4. Silicon ameliorates wheat technological quality under biotic stress;Tropical Plant Pathology;2023-02-23

5. Identification of wheat leaf diseases and their severity based on elliptical-maximum margin criterion metric learning;Sustainable Computing: Informatics and Systems;2021-06