Enhanced antireflective and laser damage resistance of refractive-index gradient SiO2 nanostructured films at 1064 nm
Author:
Wan Lili1, Yang Jie1, Liu Xiaoru1, Zhu Jiayi12, Xu Gang1, Hao Chenchun1, Chen Xuecheng3, Xiong Zhengwei1
Affiliation:
1. Joint Laboratory for Extreme Conditions Matter Properties, School of Mathematics and Physics , Southwest University of Science and Technology , Mianyang , China 2. Key Laboratory of Icing and Anti/De-icing , China Aerodynamics Research and Development Center , Mianyang , China 3. Department of Nanomaterials Physicochemistry, Faculty of Chemical Technology and Engineering , West Pomeranian University of Technology , Szczecin, Piastow Ave. 42 , Szczecin , Poland
Abstract
Abstract
A facile sol-gel procedure was employed to create refractive-index gradient SiO2 antireflective (AR) films. A monolayer film, characterized by the porous crosslinking framework, was fabricated with a designed volume ratio mixture both with colloidal silica suspension and soluble organic polysiloxane. The upper layer for the bilayer film was a hexamethylisilazane (HMDS) modified colloidal silica suspension, leading to the film surface transfer to hydrophobic. The strategic design of nanostructures in the bottom and upper layers resulted in a refractive-index gradient SiO2 film with enhanced AR properties. The bilayer film demonstrated a transmittance of 99.5% at 1064 nm, accompanied by a notable reduction in reflectivity. Moreover, the laser-induced damage threshold of the bilayer film was increased by 30%, rising to as high as 24.7 J/cm2. The SiO2 nanostructured film both showed a refractive-index gradient structure with excellent AR properties and exhibited good laser damage resistance.
Publisher
Walter de Gruyter GmbH
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