Precision of sinewave amplitude estimation in the presence of additive noise and quantization error-Reference-Cited by-同舟云学术

Precision of sinewave amplitude estimation in the presence of additive noise and quantization error

Published:2023-10-01 Issue:5 Volume:74 Page:374-381
ISSN:1339-309X
Container-title:Journal of Electrical Engineering
language:en
Short-container-title:

Author:

Alegria Francisco André Corrêa¹

Affiliation:

1. Instituto de Telecomunicações and Department of Electrotechnical Engineering and Computer Science, Technical Superior Institute , University of Lisbon , Av. Rovisco Pais, 1 , Lisbon , Portugal

Abstract

Abstract This research paper delves into a comprehensive investigation concerning the impact of additive noise and quantization error on the precision of amplitude, offset, and phase estimates of a sine wave fitted to a set of data points acquired by a waveform digitizer. Simulation results are used to validate the expressions presented.

Publisher

Walter de Gruyter GmbH

Link

https://www.sciendo.com/pdf/10.2478/jee-2023-0045

Reference21 articles.

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2. A. Cruz Serra, F. Corrêa Alegria, R. Martins and M. Fonseca da Silva, “Analog-to-digital converter testing—new proposals”, Computer Standards & Interfaces, vol. 26, nº 1, pp. 3-13, January 2004, doi: 10.1016/S0920-5489(03)00057-6.

3. F. Corrêa Alegria, P. Girão, V. Haasz, A. Cruz Serra, “Performance of Data Acquisition Systems from the User’s Point of View”, IEEE Transactions on Instrumentation and Measurement, vol. 53, no. 4, pp. 907-914, August 2004, doi: 10.1109/TIM.2004.830757.

4. F. Corrêa Alegria, Pedro Girão, Vladimir Haasz and António Serra, “Performance of Data Acquisition Systems from User’s Point of View”, IEEE Instrumentation and Measurement Technology Conference, Vail, Colorado, USA, pp. 940-945, 20-22 May 2003.

5. F. Corrêa Alegria, A. Cruz Serra, “Influence of Frequency Errors in the Variance of the Cumulative Histogram”, Conference on Precision Electromagnetic Measurements, pp. 585-586, 14-19 May 2000, Sydney Australia, doi: 10.1109/CPEM.2000.851145.

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