Changes in characteristics of gadolinium, titanium, and erbium oxide films on the SiC surface under microwave treatment-Reference-Cited by-同舟云学术

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Changes in characteristics of gadolinium, titanium, and erbium oxide films on the SiC surface under microwave treatment

Published:2008-07 Issue:7 Volume:42 Page:868-872
ISSN:1063-7826
Container-title:Semiconductors
language:en
Short-container-title:Semiconductors

Author:

Bacherikov Yu. Yu.,Konakova R. V.,Milenin V. V.,Okhrimenko O. B.,Svetlichnyi A. M.,Polyakov V. V.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1063782608070191.pdf

Reference22 articles.

1. S. B. Bludov, N. P. Gadetskiy, K. A. Kravtsov, et al., Fiz. Plazmy 20, 712 (1994) [Plasma Phys. 20, 643 (1994)].

2. A. A. Belyaev, A. E. Belyaev, I. B. Ermolovich, et al., Zh. Tekh. Fiz. 68(12), 49 (1998) [Tech. Phys. 43, 1445 (1998)].

3. T. G. Kryshtab, P. M. Lytvyn, M. A. Masin, and I. V. Prokopenko, Metal Phys. Adv. Technol. 19(3), 71 (1997).

4. D. E. Abdurakhimov, V. L. Vereshchagin, V. P. Kalinushkin, et al., Kr. Soobshch. Fiz. 6, 27 (1991).

5. O. B. Okhrimenko, Peterburg. Zh. Élektron. 1, 27 (2005).

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