X-ray and synchrotron studies of porous silicon-Reference-Cited by-同舟云学术

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X-ray and synchrotron studies of porous silicon

Published:2013-08 Issue:8 Volume:47 Page:1051-1057
ISSN:1063-7826
Container-title:Semiconductors
language:en
Short-container-title:Semiconductors

Author:

Sivkov V. N.,Lomov A. A.,Vasil’ev A. L.,Nekipelov S. V.,Petrova O. V.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1063782613080174.pdf

Reference20 articles.

1. L. T. Canham, Appl. Phys. Lett. 57, 1046 (1990).

2. L. T. Canham, T. I. Cox, A. Loni, and A. J. Simons, Appl. Surf. Sci. 102, 436 (1996).

3. G. Korotchenkov and B. K. Cho, Crit. Rev. Solid State Mater. Sci. 35, 1 (2010).

4. H. Foll, M. Leisner, A. Cojocaru, and J. Carstensen, Materials 3, 3006 (2010).

5. T. V. Voloshina, T. N. Zavaritskaya, I. V. Kavetskaya, V. A. Karavanskii, and D. A. Romashov, J. Appl. Spectrosc. 69, 275 (2002).

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