The least number of pairs of layers needed for observation of satellite-structured X-ray diffraction in superlattices. Measurements and calculations of elastic stresses in alternate layers of superlattices-Reference-Cited by-同舟云学术

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The least number of pairs of layers needed for observation of satellite-structured X-ray diffraction in superlattices. Measurements and calculations of elastic stresses in alternate layers of superlattices

Published:2009-02 Issue:2 Volume:43 Page:245-252
ISSN:1063-7826
Container-title:Semiconductors
language:en
Short-container-title:Semiconductors

Author:

Kuznetsov G. F.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1063782609020237.pdf

Reference31 articles.

1. J. Hornstra and W. J. Bartels, J. Cryst. Growth 44, 513 (1978).

2. Yu. P. Khapachev, A. V. Kolpakov, G. F. Kuznetsov, and R. N. Kuz’min, Kristallografiya 24, 430 (1979) [Sov. Phys. Crystallogr. 24, 250 (1979)].

3. Yu. P. Khapachev and G. F. Kuznetsov, Kristallografiya 28(1), 27 (1983) [Sov. Phys. Crystallogr. 28, 12 (1983)].

4. K. Kabutov, O. E. Korobov, G. F. Kuznetsov, V. N. Maslov, and Yu. P. Khapachev, Kristallografiya 28, 647 (1983) [Sov. Phys. Crystallogr. 28, 380 (1983)].

5. G. F. Kuznetsov, A. S. Ignat’ev, and V. A. Kusikov, Dep. VINITI No. 200-093 (1993).

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